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Position: Home > Articles > Influence of Damages on Electrical Parameter Values of Apples Transactions of the Chinese Society for Agricultural Machinery 2006,37 (8) 128+139-141

损伤对苹果电参数值的影响

作  者:
郭文川;朱新华;郭康权
关键词:
苹果;损伤;电参数;相对介电常数;电阻率
摘  要:
为了探索以电学特性识别损伤果品的方法,以富士苹果为对象进行了撞击和静压损伤对苹果电参数值影响的试验。结果表明,在苹果发生损伤后0.5h内,其相对介电常数和电阻率急剧变化,3h后趋于稳定,而同期无损苹果的相对介电常数和电阻率基本保持不变。储藏期间,撞击损伤苹果的相对介电常数持续增大并出现跃变;静压损伤苹果的相对介电常数迅速增大后保持不变,而无损苹果的相对介电常数一直保持增大趋势。
译  名:
Influence of Damages on Electrical Parameter Values of Apples
作  者:
Guo Wenchuan Zhu Xinhua Guo Kangquan (Northwest A&F University)
关键词:
Apples, Damages, Electrical parameters, Relative dielectric constant, Electrical resistivity
摘  要:
Apples were used to find influence of bump and static press damages on electrical parameters in order to find a new method in identifying damaged fruits according to the electrical properties. Test results showed that relative dielectric constant ε′KG-3 _r, and resistivity ρ, of Fuji apples with bump damage or static press damage changed sharply within 0.5 h after damaged,restored rapidly after 0.5 h and became stable during 3~12 h, and ρ of apples without damages kept constant in this period. During storage period,ε′KG-3 _r of apples with bump damage changed abruptly in continuous increasing and that of apples with press damage increased rapidly in earlier storage period and kept constant in later period. Contrasted with damaged apples,ε′KG-3 _r of undamaged apples increased continuously.

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