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Position: Home > Articles > QTL and candidate genes associated with common bacterial blight resistance in the common bean cultivar Longyundou 5 from China The Crop Journal 2016,4 (5)

QTL and candidate genes associated with common bacterial blight resistance in the common bean cultivar Longyundou 5 from China

作  者:
Jifeng Zhu;Jing Wu;Lanfen Wang;Matthew W. Blair;Zhendong Zhu;Shumin Wan
单  位:
Institute of Crop Science, Chinese Academy of Agricultural Sciences, Beijing 100081, Chin;Institute of Crop Science, Chinese Academy of Agricultural Sciences, Beijing 100081, China;Department of Agriculture & Environment, Tennessee State University, Nashville, TN, USA
关键词:
Common bean (Phaseolus vulgaris L.);Common bacterial blight;Quantitative trait locus;Days after inoculatio
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