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Position: Home > Articles > Characterization and mapping of QTLs on chromosome 2D for grain size and yield traits using a mutant line induced by EMS in wheat The Crop Journal 2015,3 (2)

Characterization and mapping of QTLs on chromosome 2D for grain size and yield traits using a mutant line induced by EMS in wheat

作  者:
Guizhi Zhang;Yingying Wang;Ying Guo;Yan Zhao;Fanmei Kong;Sishen L
单  位:
State Key Laboratory of Crop Biology/Shandong Key Laboratory of Crop Biology, Shandong Agricultural University, Tai'an 271018, China;State Key Laboratory of Crop Biology/Shandong Key Laboratory of Crop Biology, Shandong Agricultural University, Tai'an 271018, Chin
关键词:
Common wheat;Mutant;Simple sequence repeat (SSR);Quantitative trait locus (QTL);Grain size trait;Yield trai

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