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Position: Home > Articles > Determination of Wheat Flour Adulteration Based on Near- and Mid-Infrared Spectroscopy FOOD SCIENCE 2014,35 (12) 128-132

基于近红外和中红外光谱技术的小麦粉品质检测及掺杂鉴别方法

作  者:
徐一茹;刘翠玲;孙晓荣;吴胜男;董秀丽
单  位:
北京工商大学计算机与信息工程学院
关键词:
小麦粉;近红外光谱;中红外光谱;偏最小二乘法;聚类分析
摘  要:
针对国家标准法检测小麦粉品质的传统方法存在一定缺陷,提出基于近红外光谱和中红外光谱技术快速检测面粉的方法,并基于偏最小二乘法建立了矫正模型,对小麦粉的灰分、水分、面筋品质指标进行了分析。对于小麦粉的掺杂鉴别问题,基于标准法测光谱距离建立了聚类分析模型,结果表明,可实现对小麦面粉品质的快速检测及掺杂鉴别。
译  名:
Determination of Wheat Flour Adulteration Based on Near- and Mid-Infrared Spectroscopy
作  者:
XU Yi-ru;LIU Cui-ling;SUN Xiao-rong;WU Sheng-nan;DONG Xiu-li;School of Computer Science and Information Engineering, Beijing Technology and Business University;
关键词:
wheat flour;;near-infrared spectroscopy;;mid-infrared spectroscopy;;partial least squares;;cluster analysis
摘  要:
A rapid method for the identification of wheat flour adulteration using near- and mid-infrared(NIR-MIR) spectroscopy was proposed to overcome the shortcomings of the conventional method described in the Chinese national standard. A calibration model was established using partial least squares regression analysis, and chemical analysis of wheat flour was performed for ash, moisture and gluten. Moreover, a clustering analysis model was developed based on the spectral distances measured by the standardized method to identify wheat flour adulteration. Our experimental results confirm that this NIR-MIR spectroscopic method permits the rapid identification of wheat flour adulteration.

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