当前位置: 首页 > 文章 > 近红外光谱快速检测小麦面粉中滑石粉含量研究——基于PLS 农机化研究 2013 (7) 189-193
Position: Home > Articles > The Research of Detection of Talc-contaning Flour Based on Near-infrared Spectroscopy Using PLS Journal of Agricultural Mechanization Research 2013 (7) 189-193

近红外光谱快速检测小麦面粉中滑石粉含量研究——基于PLS

作  者:
刘翠玲;董秀丽;孙晓荣;吴静珠;吴胜男
单  位:
北京工商大学计算机与信息工程学院
关键词:
小麦面粉;滑石粉;近红外光谱;偏最小二乘法
摘  要:
应用近红外光谱技术分别对含滑石粉的小麦面粉样品进行快速检测,对使用不同方法预处理后的光谱采用偏最小二乘法(PLS)建立定量分析模型。同时,比较各个模型内部交互验证均方根误差(RMSECV)、交互验证预测值与真实值间的相关系数(R2)和外部均方根误差(RMSEP),选取最优模型。实验表明:使用多元散射校正预处理方法所得效果最好,应用近红外光谱在分析检测小麦面粉中滑石粉含量方面有广阔的应用前景。
译  名:
The Research of Detection of Talc-contaning Flour Based on Near-infrared Spectroscopy Using PLS
作  者:
Liu Cuiling,Dong Xiuli,Sun Xiaorong,Wu Jingzhu,Wu Shengnan(College of Computer and Information Engineering,Beijing Technology and Business University,Beijing 100048,China)
关键词:
near infrared spectrum;PLS;wheat flour;talcum powder
摘  要:
A rapid method was used to determine the talc-containing wheat flour with near infrared spectrum technology.Different mathematical models were built separately by using partial least squares(PLS) for each pretreatment method processed data.The influence of data number on building PLS model was discussed,with internal cross-validation root mean square error(RMSECV),cross-validation correlation coefficient between the predicted value and the true value(R2),and External root mean square error(RMSEP),choosed the best model.The results showed that:the result gotten from Multiplicative scatter correction(SNV) was the best.There is widest prospects on determine the talc-containing wheat flour with NIR.

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